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ATEC-CONTAu-10 5X Stability: Thanks to its simple

SKU: 21473880728

4.8
USD768.70 USD807.70

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Description

Stability: Thanks to its simple and durable construction

excellent edge definition

Roughness: Typically 2-3Å

It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging

*Uses average data measured for each production wafer

ATEC-CONTAu-10 5X Stability: Thanks to its simpleDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
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