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nanoscratching
Highly wear resistant
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend
5 Tip Radius (Nom): 10 Tip Radius (Max): 15 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3
FIB6-400A 110 kHz nanoscratching42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 Back Angle: 11 31 Side Angle: 1. 7 Tip Radius (Nom): 10
