E-Beam Lithography Mount 5WF identification number stamped on each

identification number stamped on each box

and DTFMLPC

conductivity measurements (C-AFM and PeakForce TUNA)

005 Ohm·cm

24 letter labeled slots are available for electron microscopy grid storage with 2 numbered spaces for blocks

E-Beam Lithography Mount 5WF identification number stamped on eachDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain