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Silicon n-type <100> calibration structure
Precision cutting tweezers for fine wire in electronics and thin film research
the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
Dimensions of 25 TEM grid version: 35 x 35 x 6
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2
Maxtaform Style H7 TipChecker Silicon n-type <100> calibration structureDESCRIPTION Maxtaform Style H7 Mesh: 400 Pitch: 63 microns Hole: 51 microns Bar Width: 12 microns Transmission: 65% Maxtaform Reference Finder Grids, Style H7, 400 mesh, Copper, 100 vial Maxtaform Reference Finder Grids, Style H7, 400 mesh, Nickel, 100 vial Reference Finder Grids for Transmission Electron Microscopy A selection of TEM grids with reference patterns to enable relocating a particular grid area. Theses grids are known as reference,
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