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Silicon p-type <100> calibration structure
- Automatic image optimization for faster
Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe
4-Sided Tip
Aspect ratio of 15:1 at 6um from tip apex
SCMSAMPLE 48 N/m Silicon p-type <100> calibration structureScanning Capacitance Sample, on 15mm Puck DESCRIPTION CANTILEVER SPECIFICATIONS Scanning Capacitance Sample, on 15mm Puck. This sample shown domains when imaged in SCM mode. The sample is included with SCM application modules. Mounted on 15mm sample puck. For more information about this sample, view the Application Note. This sample shows domains when imaged in SCM mode. The sample is included with SCM application modules. Mounted on 15mm or 18mm
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