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The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy
Extra Fine Point
these are formed out of single crystal boron doped diamond and are wear resistant and conductive
A pack of 10 High quality etched silicon probes for soft TappingMode™ and other non-contact modes
SAPPHIRE-12M
SEM Magnification Standard and Stage Micrometer MRS-4 - Retainer for MRS-4 13kHz The range in force constantsDESCRIPTION Protective Retainer for MRS 3 4, SEM, 1" x 0. 125" (25. 4 x 3. 18mm) with clear hole for transmission measurements. Standard recessed 0. 02" (0. 5mm) The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies
